Keithley 4200A-SCS Parameter Analyzer

Overview

Parametric insight, fast and clear.

Making connections to your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces characterization complexity and test setup by up to 50%, providing clear, uncompromised measurement and analysis capability. Plus, embedded measurement expertise - an industry first - provides test guidance and gives you supreme confidence in your results.

Highlights

• Built-in measurement videos in English, Chinese, Japanese, and Korean
• Jump start your testing with hundreds of user-modifiable application tests
• Automated real-time parameter extraction, data graphing, arithmetic functions

Measure. Switch. Repeat.

The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur. 

Highlights

• Move C-V measurement to any device terminal without re-cabling
• User-configurable for low current capability
• Personalize the names of output channels
• View real-time test status

Stable low current measurements for I-V Characterization

With the 4201-SMU and 4211-SMU modules you can achieve stable low current measurements in a high capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field Installable Units and optional preamplifier modules, Keithley makes sure that you can make the most accurate low current measurements with little to no downtime.

Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU

Highlights

• Add an SMU without an sending the instrument back to the factory

• Make femptoamp measurements

• Up to 9 SMU channels

• Optimized for long cables or large chucks

Integrated solution with analytical probers and cryogenic controllers.

The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.

Highlights

• "Point and click" test sequencing
• "Manual" prober mode tests prober functionality
• Fake prober mode enables debugging without removing commands

Modules

Applications

Semiconductor Reliability

Perform complex reliability tests while letting the 4200A-SCS take care of the complexities. Included projects like Hot Carrier Injection Degradation (HCI) and Negative Bias Temperature Instability (NBTI) give you a jump start on device analysis. For larger labs, the 4200-BTI package includes site mapping and automatic prober control with Keithley’s ACS software.

Evaluating Hot Carrier Induced Degradation of MOSFET Devices

Highlights

• Combine DC I-V, C-V, and pulse measurements in one set of tests
• Included support for many probe stations and external instruments
• Easy to use cycling system allows repeat measurements without coding

C-V Measurement for High Impedance Applications

Use Keithley’s custom Very Low Frequency C-V Technique to analyze the capacitance of your high resistance sample. This technique is performed using only source measure unit (SMU) instruments but can be combined with a 4210-CVU to perform higher frequency measurements as well.

Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the 4200A-SCS Parameter Analyzer 

Tips and Techniques to Simplify MOSFET/MOSCAP Device Characterization

Highlights

• .01 to 10 Hz frequency range with sensitivity of 1 pF to 10 nF
• 3½-digit typical resolution, minimum typical of 10 fF

Non-volatile Memory

Put your new technologies to the test with thorough pulsed I-V characterization. The 4200A-SCS comes with support and ready-to-run tests for the latest in NVRAM technologies from floating gate flash to ReRAM and FeRAM. Dual sourcing and measuring capabilities in current and voltage allow both transient and I-V domain characterization.

Single Nanosecond Pulsing Solutions for Non-Volatile Memory Testing

Pulse I-V Characterization of Non-Volatile Memory Technologies

Testing when using Long Cables or Capacitive Fixtures

Use 4201 or 4211-SMUs when making tests requires very long cabling or fixtures with higher capacitances. These SMUs are ideal for connecting to LCD test stations, probers, switch matrices or any other large or complicated tester. Field installable versions allow you to add capacity without returning the unit to a service center.  

Nanoscale Device Characterization  

The integrated instrument capabilities of the 4200A-SCS simplify the measurement requirements in developing nanoscale electronics such as carbon nanotubes. Start your investigations from a preconfigured test project and expand your work from there. A pulsed source mode for SMUs helps reduce overheating problems can be combined with low voltage C-V and ultra-fast pulsed DC measurements in seconds.  

Electrical Characterization of Carbon Nanotube 
Transistors (CNT FETs)

Resistivity of Materials

Use a 4200A-SCS with integrated SMUs to easily measure resistivity using a four-point collinear probe or van der Pauw method. Included tests perform repetitive van der Pauw calculations automatically, saving you valuable research time. A maximum current resolution of 10aA and input impedance of >10­­­­16 ohms give you more accurate and precise results.  

Resistivity Measurements of Semiconductor Materials Using the 4200A-SCS Parameter Analyzer and a Four-Point Collinear Probe

van der Pauw and Hall Voltage Measurements with the4200A-SCS Parameter Analyzer

 MOSFET Characterization

The 4200A-SCS can hold all the instruments necessary for full characterization of MOS devices through component or on-wafer testing. Included tests and projects solve for oxide thickness of a MOSCap, threshold voltages, doping concentration, mobile ion concentration, and more. All these tests can be run at the touch of a button from a single instrument box.  

C-V Characterization of MOS Capacitors Using the 4200A-SCS Parameter Analyzer